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Deep level studies of Hg1−xCdxTe. II: Correlation with photodiode performance

JOURNAL ARTICLE published 1 August 1981 in Journal of Applied Physics

Authors: D. L. Polla | M. B. Reine | C. E. Jones

Frequency dependence of ion bombardment of grounded surfaces in rf argon glow discharges in a planar system

JOURNAL ARTICLE published 1 November 1985 in Journal of Applied Physics

Authors: K. Köhler | D. E. Horne | J. W. Coburn

Current–voltage characteristics of polar heterostructure junctions

JOURNAL ARTICLE published 1 March 2002 in Journal of Applied Physics

Authors: Madhusudan Singh | Jasprit Singh | Umesh Mishra

Photoreflectance study of the surface state density and distribution function of InAlAs

JOURNAL ARTICLE published 1 January 2001 in Journal of Applied Physics

Authors: J. S. Hwang | W. C. Hwang | C. C. Chang | S. C. Chen | Y. T. Lu

Annealing of boron-implanted corrosion resistant copper films

JOURNAL ARTICLE published 15 July 1993 in Journal of Applied Physics

Authors: P. J. Ding | W. A. Lanford | S. Hymes | S. P. Murarka

Determination of the local microstructure of epitaxial AlN by x-ray absorption

JOURNAL ARTICLE published 1 August 1997 in Journal of Applied Physics

Authors: M. Katsikini | E. C. Paloura | T. S. Cheng | C. T. Foxon

Capacitance of Thin Dielectric Structures

JOURNAL ARTICLE published 1 February 1964 in Journal of Applied Physics

Authors: H. Y. Ku | F. G. Ullman

Effects of Contact Placement and Sample Shape in the Measurement of Electrical Resistivity

JOURNAL ARTICLE published 1 June 1971 in Journal of Applied Physics

Authors: A. E. Stephens | H. J. Mackey | J. R. Sybert

Interface states at the anodized Al2O3-metal interface

JOURNAL ARTICLE published 15 May 2001 in Journal of Applied Physics

Authors: T. W. Hickmott

Thermal cross-track cross talk in phase-change optical disk data storage

JOURNAL ARTICLE published 1 August 2000 in Journal of Applied Physics

Authors: Chubing Peng | M. Mansuripur

Emission channeling studies of Pr in GaN

JOURNAL ARTICLE published 1 August 2000 in Journal of Applied Physics

Authors: U. Wahl | A. Vantomme | G. Langouche | J.P. Araújo | L. Peralta | J. G. Correia | ISOLDE Collaboration

Inhomogeneity of anodic oxide films of Al and Al alloys characterized by scanning electron microscopy observation and analysis of frequency response behavior

JOURNAL ARTICLE published 1 February 1999 in Journal of Applied Physics

Authors: Kiyoshi Ozawa | Teiji Majima

Time-resolved photoluminescence measurement of the energy relaxation process in GaAs/AlGaAs quantum-well structures

JOURNAL ARTICLE published 1 July 1995 in Journal of Applied Physics

Authors: T. Furuta | M. Tomizawa | A. Yoshii

Combinatorial (Ba,Sr)TiO3 thin film growth: X-ray diffraction and Raman spectroscopy

JOURNAL ARTICLE published 1 August 2009 in Journal of Applied Physics

Authors: H. Bouyanfif | J. Wolfman | M. El Marssi | Y. Yuzyuk | R. Bodeux | M. Gervais | F. Gervais

Temperature dependence of the photoluminescence spectra of single crystals of CuInTe2

JOURNAL ARTICLE published 1 November 1997 in Journal of Applied Physics

Authors: C. Rincón | S. M. Wasim | G. Marı́n | G. Sánchez Pérez | G. Bacquet

Substrate bias effect on the formation of nanocrystalline diamond films by microwave plasma-enhanced chemical vapor deposition

JOURNAL ARTICLE published 15 August 2002 in Journal of Applied Physics

Authors: Tien-Syh Yang | Jir-Yon Lai | Ming-Show Wong | Chia-Liang Cheng

Different ‘‘single grain junctions’’ within a ZnO varistor

JOURNAL ARTICLE published 15 February 1987 in Journal of Applied Physics

Authors: M. Tao | Bui Ai | O. Dorlanne | A. Loubiere

Behavior of a multiloop dc superconducting quantum interference device

JOURNAL ARTICLE published 1 November 1982 in Journal of Applied Physics

Authors: P. Carelli | V. Foglietti

Monte Carlo study of electron transport in SiC

JOURNAL ARTICLE published 15 March 1998 in Journal of Applied Physics

Authors: Rimvydas Mickevičius | Jian H. Zhao

Schottky contact and the thermal stability of Ni on n-type GaN

JOURNAL ARTICLE published 1 August 1996 in Journal of Applied Physics

Authors: J. D. Guo | F. M. Pan | M. S. Feng | R. J. Guo | P. F. Chou | C. Y. Chang