Metadata Search Funding Data Link References Status API Help
Facet browsing currently unavailable
Page 5 of 4875 results
Sort by: relevance publication year

Courses in Quality and Reliability

JOURNAL ARTICLE published October 1986 in Quality and Reliability Engineering International

Designing for minimal maintenance expense, Marvin A. Moss, Marcel Dekker, 1985. No. of pages: 167. Price: $39.75 (U.S.A.), £47.50 elsewhere

JOURNAL ARTICLE published January 1986 in Quality and Reliability Engineering International

Authors: P. D. T. O'Connor

Stochastic models in reliability theory: Proceedings of symposium held in Japan, 1984, S. Osaki and Y. Hatoyama (Eds), Springer‐Verlag 1986. No. of pages: 212. Price: DM 37.00

JOURNAL ARTICLE published January 1987 in Quality and Reliability Engineering International

Authors: Rene. V. V. Vidal

Integrated Product Testing and Evaluation (Revized edn), HAROLD L. GILMORE and HERBERT C. SCHWARTZ. Marcel Dekker, 1986. No. of pages: 376. Price $49.50 (US and Canada): $59.50 (elsewhere)

JOURNAL ARTICLE published October 1986 in Quality and Reliability Engineering International

Authors: P.D.T.O' CONNOR

Directory of statistical microcomputer software, 1985 edn, Wayne A. Woodward, Alan C. Elliott and Henry L. Gray, Marcel Dekker Inc., 1985

JOURNAL ARTICLE published January 1986 in Quality and Reliability Engineering International

Authors: L. N. Harris

News Digest

JOURNAL ARTICLE published January 1988 in Quality and Reliability Engineering International

Early life failures

JOURNAL ARTICLE published January 1988 in Quality and Reliability Engineering International

Authors: Burton A. Unger

Reliability theory and applications, proceedings of the China‐Japan reliability symposium, 13–25 september 1987, Shanghai, Xian and Beijing, China. edited by Shunji Osaki and Jinhua Cao. world scientific publishing co., 1987, distributed by John Wiley and sons. number of pages: 445. price: $47.15 (U.K.)

JOURNAL ARTICLE published October 1988 in Quality and Reliability Engineering International

Authors: Myron Lipow | Kam L. Wong

International calendar of forthcoming events

JOURNAL ARTICLE published April 1988 in Quality and Reliability Engineering International

Or, the wonderful “one‐hoss shay” a logical story oliver wendell holmes

JOURNAL ARTICLE published July 1987 in Quality and Reliability Engineering International

Authors: OLIVER WENDELL HOLMES

Robust inference, M. L. Tiku, W. Y. Tan and N. Bala‐krishnan, Marcel Dekker, 1986. No. of pages: 321. Price: $59.75 (US and Canada), $71.50 (elsewhere)

JOURNAL ARTICLE published April 1987 in Quality and Reliability Engineering International

Authors: C. T. Gray

Handbook of standards and certification requirements for software, Ole Andersen and Poul Grav Petersen, Report Number ECR‐182, Elektronikcentralen, Venlighedsvej 4, Denmark

JOURNAL ARTICLE published January 1987 in Quality and Reliability Engineering International

Authors: L. N. Harris

International Calendar of Forthcoming Events

JOURNAL ARTICLE published April 1986 in Quality and Reliability Engineering International

Quality by Experimental Design, Thomas B. Barker, Marcel Dekker, 1985. No. of pages: 384

JOURNAL ARTICLE published July 1986 in Quality and Reliability Engineering International

Authors: L.N. HARRIS.

JOURNAL ISSUE published July 1986 in Quality and Reliability Engineering International

A new approach to reliability prediction is needed

JOURNAL ARTICLE published April 1986 in Quality and Reliability Engineering International

Authors: Radu A. Florescu

Masthead

JOURNAL ARTICLE published July 1986 in Quality and Reliability Engineering International

Quality and reliability assurance for electronic systems—actions and results

JOURNAL ARTICLE published April 1986 in Quality and Reliability Engineering International

Authors: Urs Ender

How do you get quality‐the japanese ways revisited

JOURNAL ARTICLE published April 1986 in Quality and Reliability Engineering International

Authors: KAM L. WONG.

The test needs of application‐specific integrated circuits

JOURNAL ARTICLE published July 1986 in Quality and Reliability Engineering International

Authors: Chris Davison