RELIABILITY CHALLENGES FOR LOW VOLTAGE/LOW POWER INTEGRATED CIRCUITS

JOURNAL ARTICLE published July 1996 in Quality and Reliability Engineering International

Authors: J. M. GALBRAITH | K. F. GALLOWAY | R. D. SCHRIMPF | G. H. JOHNSON

Diagnosing the health of engineering systems

JOURNAL ARTICLE published September 1997 in Quality and Reliability Engineering International

Authors: Roy Billinton | Saleh Aboreshaid | Mahmud Fotuhi-Firuzabad

Memory‐type t charts with multiple auxiliary information for the process mean

JOURNAL ARTICLE published December 2021 in Quality and Reliability Engineering International

Authors: Abdul Haq | Michael B. C. Khoo | Jennifer Brown

The Handbook of Machine Soldering: SMT and TH, Ralph W. Woodgate, Wiley-Interscience (third edition), 1996. Number of pages: 321. Price: £50.00/$65.95.

JOURNAL ARTICLE published March 1997 in Quality and Reliability Engineering International

Authors: P.D.T. O'CONNOR

Directionally sensitive MCUSUM mean charts

JOURNAL ARTICLE published July 2021 in Quality and Reliability Engineering International

Authors: Abdul Haq | Komal Sohrab

Masthead

JOURNAL ARTICLE published May 1991 in Quality and Reliability Engineering International

Modern reliability assurance of integrated circuits—A strategy based on technology capability assessment and production reproducibility control

JOURNAL ARTICLE published July 1991 in Quality and Reliability Engineering International

Authors: W. Gerling

Bimodal lifetime distributions of dielectrics for integrated circuits

JOURNAL ARTICLE published July 1991 in Quality and Reliability Engineering International

Authors: K. v. Sichart | R.‐P. Vollertsen

Low frequency noise analysis to detect the influence of deep levels in AlGaAs/GaAs st

JOURNAL ARTICLE published January 1992 in Quality and Reliability Engineering International

Authors: N. Labat | D. Ouro Bodi | A. Touboul | Y. Danto | J.‐M. Dumas

Accelerated life‐test experiments on low‐power rectifier diodes

JOURNAL ARTICLE published April 1990 in Quality and Reliability Engineering International

Authors: Joachim Windel

A comparative reliability assessment of 750nm, 1060nm and 1300nm high power surface light emitting diodes

JOURNAL ARTICLE published March 1993 in Quality and Reliability Engineering International

Authors: C. E. Lindsay

International calendar of forthcoming events

JOURNAL ARTICLE published January 1994 in Quality and Reliability Engineering International

Courses in quality and reliability

JOURNAL ARTICLE published January 1994 in Quality and Reliability Engineering International

Implementation of laser beam sensitive cells: A new approach for integrated circuits testing

JOURNAL ARTICLE published January 1994 in Quality and Reliability Engineering International

Authors: P. Fouillat | S. Gervais‐Ducouret | H. Lapuyade | J. P. Dom

About thie special issue

JOURNAL ARTICLE published September 1990 in Quality and Reliability Engineering International

Authors: Kam L. Wong

Masthead

JOURNAL ARTICLE published January 1994 in Quality and Reliability Engineering International

Courses in quality and reliability

JOURNAL ARTICLE published January 1994 in Quality and Reliability Engineering International

International calendar of forthcoming events

JOURNAL ARTICLE published July 1991 in Quality and Reliability Engineering International

Asics failure analysis using two complementary techniques: External electrical testing and internal contactless laser beam testing

JOURNAL ARTICLE published January 1992 in Quality and Reliability Engineering International

Authors: C. Bouvet | P. Fouillat | J. P. Dom | Y. Danto

The effect of barrier layers on the distribution function of interconnect electromigration failures

JOURNAL ARTICLE published July 1991 in Quality and Reliability Engineering International

Authors: Mario Pinto