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Directionally sensitive MCUSUM mean charts JOURNAL ARTICLE published July 2021 in Quality and Reliability Engineering International |
Masthead JOURNAL ARTICLE published May 1991 in Quality and Reliability Engineering International |
Modern reliability assurance of integrated circuits—A strategy based on technology capability assessment and production reproducibility control JOURNAL ARTICLE published July 1991 in Quality and Reliability Engineering International |
Bimodal lifetime distributions of dielectrics for integrated circuits JOURNAL ARTICLE published July 1991 in Quality and Reliability Engineering International |
Low frequency noise analysis to detect the influence of deep levels in AlGaAs/GaAs st JOURNAL ARTICLE published January 1992 in Quality and Reliability Engineering International |
Accelerated life‐test experiments on low‐power rectifier diodes JOURNAL ARTICLE published April 1990 in Quality and Reliability Engineering International |
A comparative reliability assessment of 750nm, 1060nm and 1300nm high power surface light emitting diodes JOURNAL ARTICLE published March 1993 in Quality and Reliability Engineering International |
International calendar of forthcoming events JOURNAL ARTICLE published January 1994 in Quality and Reliability Engineering International |
Courses in quality and reliability JOURNAL ARTICLE published January 1994 in Quality and Reliability Engineering International |
Implementation of laser beam sensitive cells: A new approach for integrated circuits testing JOURNAL ARTICLE published January 1994 in Quality and Reliability Engineering International |
About thie special issue JOURNAL ARTICLE published September 1990 in Quality and Reliability Engineering International |
Masthead JOURNAL ARTICLE published January 1994 in Quality and Reliability Engineering International |
Courses in quality and reliability JOURNAL ARTICLE published January 1994 in Quality and Reliability Engineering International |
International calendar of forthcoming events JOURNAL ARTICLE published July 1991 in Quality and Reliability Engineering International |
Asics failure analysis using two complementary techniques: External electrical testing and internal contactless laser beam testing JOURNAL ARTICLE published January 1992 in Quality and Reliability Engineering International |
The effect of barrier layers on the distribution function of interconnect electromigration failures JOURNAL ARTICLE published July 1991 in Quality and Reliability Engineering International |
Environmental testing and component reliability observations of telecommunications equipment operated in tropical climatic conditions JOURNAL ARTICLE published January 1992 in Quality and Reliability Engineering International |
Achieve Total Quality, D. Hutchins, Director Books/Prentice Hall, 1992. Number of pages: 197. Price: £29.95 JOURNAL ARTICLE published January 1992 in Quality and Reliability Engineering International |
Detection of process upsets—sample autocorrelation control chart and group autocorrelation control chart applications JOURNAL ARTICLE published May 1991 in Quality and Reliability Engineering International |
Right Every Time, Frank Price, Gower Press, 1990. Number of pages: 182. Price £25.00 JOURNAL ARTICLE published April 1990 in Quality and Reliability Engineering International |