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Showing results for ISSN matching 0894-6507

A Novel Design Flow for Dummy Fill Using Boolean Mask Operations

JOURNAL ARTICLE published August 2012 in IEEE Transactions on Semiconductor Manufacturing

Authors: Mango C.-T Chao | P. A. Fisher

https://doi.org/10.1109/tsm.2012.2190431 Actions

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JOURNAL ARTICLE published February 2012 in IEEE Transactions on Semiconductor Manufacturing

https://doi.org/10.1109/tsm.2012.2185629 Actions

Improved Variable EWMA Controller for General ARIMA Processes

JOURNAL ARTICLE published May 2015 in IEEE Transactions on Semiconductor Manufacturing

Research funded by National Natural Science Foundation of China (NSFC#61104061)

Authors: Ming-Da Ma | Jia-Yi Li

https://doi.org/10.1109/tsm.2015.2419453 Actions

Special Section on the International Conference on Microelectronic Test Structures

JOURNAL ARTICLE published May 2012 in IEEE Transactions on Semiconductor Manufacturing

Authors: Richard A. Allen

https://doi.org/10.1109/tsm.2011.2181675 Actions

Test Structure for High Voltage LD-MOSFET Device Mismatch Investigations

JOURNAL ARTICLE published May 2012 in IEEE Transactions on Semiconductor Manufacturing

Authors: Werner Posch | Christian Murhammer | Ehrenfried Seebacher

https://doi.org/10.1109/tsm.2011.2181657 Actions

Table of contents

JOURNAL ARTICLE published February 2013 in IEEE Transactions on Semiconductor Manufacturing

https://doi.org/10.1109/tsm.2013.2239512 Actions

2-D Simulator of Laser Crystallization for Polycrystalline-Silicon Thin-Film Transistors

JOURNAL ARTICLE published August 2011 in IEEE Transactions on Semiconductor Manufacturing

Authors: Kuniaki Matsuki | Ryusuke Saito | Shuji Tsukamoto | Mutsumi Kimura

https://doi.org/10.1109/tsm.2011.2154368 Actions

Development of an Energy-Saving Controller for Sub Apparatus

JOURNAL ARTICLE published November 2017 in IEEE Transactions on Semiconductor Manufacturing

Authors: Toshiya Ozaki

https://doi.org/10.1109/tsm.2017.2759307 Actions

2012 IEEE Bipolar/Bicmos Circuits and Technology Meeting (BCTM)

JOURNAL ARTICLE published May 2012 in IEEE Transactions on Semiconductor Manufacturing

https://doi.org/10.1109/tsm.2012.2196470 Actions

Best Paper Award and Changes to the Editorial Board

JOURNAL ARTICLE published May 2013 in IEEE Transactions on Semiconductor Manufacturing

Authors: Sean P. Cunningham

https://doi.org/10.1109/tsm.2013.2259319 Actions

IEEE Transactions on Semiconductor Manufacturing publication information

JOURNAL ARTICLE published November 2011 in IEEE Transactions on Semiconductor Manufacturing

https://doi.org/10.1109/tsm.2011.2172749 Actions

Multiproduct Lot Merging–Splitting Algorithms for Semiconductor Wafer Fabrication

JOURNAL ARTICLE published May 2012 in IEEE Transactions on Semiconductor Manufacturing

Authors: June-Young Bang | Yeong-Dae Kim | Seong-Woo Choi

https://doi.org/10.1109/tsm.2012.2189784 Actions

A liftoff process using edge detection (LOPED)

JOURNAL ARTICLE published 1988 in IEEE Transactions on Semiconductor Manufacturing

Authors: P.L. Pai | W.G. Oldham

https://doi.org/10.1109/66.4366 Actions

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JOURNAL ARTICLE published May 2018 in IEEE Transactions on Semiconductor Manufacturing

https://doi.org/10.1109/tsm.2018.2827343 Actions

Guest Editorial Special Section on the Advanced Semiconductor Manufacturing Conference

JOURNAL ARTICLE published May 2011 in IEEE Transactions on Semiconductor Manufacturing

Authors: Eric Eisenbraun | Franz-Josef Kahlen | Paul Werbaneth | Viraj Pandit

https://doi.org/10.1109/tsm.2011.2123230 Actions

Influence of the On-Chip Metallization on Self-Heating in Integrated Power Technologies

JOURNAL ARTICLE published May 2014 in IEEE Transactions on Semiconductor Manufacturing

Authors: Martin Pfost | Cristian Boianceanu | Ioana Lascau | Dan-Ionut Simon | Sebastian Sosin

https://doi.org/10.1109/tsm.2014.2306683 Actions

Evolving complexity and cost dynamics in the semiconductor industry

JOURNAL ARTICLE published 1996 in IEEE Transactions on Semiconductor Manufacturing

Authors: D.A. Hicks

https://doi.org/10.1109/66.536102 Actions

Defect detection algorithm for wafer inspection based on laser scanning

JOURNAL ARTICLE published 1997 in IEEE Transactions on Semiconductor Manufacturing

Authors: M. Nikoonahad | C.E. Wayman | S.A. Biellak

https://doi.org/10.1109/66.641488 Actions

IEEE Transactions on Semiconductor Manufacturing publication information

JOURNAL ARTICLE published February 2012 in IEEE Transactions on Semiconductor Manufacturing

https://doi.org/10.1109/tsm.2012.2184961 Actions

Segregating Preventive Maintenance Work for Cycle Time Optimization

JOURNAL ARTICLE published February 2013 in IEEE Transactions on Semiconductor Manufacturing

Authors: Adar A. Kalir

https://doi.org/10.1109/tsm.2012.2234152 Actions
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