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Showing results for ISSN matching 0894-6507

Transport Phenomena in a Novel Large MOCVD Reactor for Epitaxial Growth of GaN Thin Films

JOURNAL ARTICLE published February 2012 in IEEE Transactions on Semiconductor Manufacturing

Authors: Lianqiao Yang | Zunmiao Chen | Jianhua Zhang | Alan G. Li

https://doi.org/10.1109/tsm.2011.2168986 Actions

Fast RF-CV Characterization Through High-Speed 1-port S-Parameter Measurements

JOURNAL ARTICLE published August 2012 in IEEE Transactions on Semiconductor Manufacturing

Authors: R. W. Herfst | P. G. Steeneken | M. P. J. Tiggelman | J. Stulemeijer | J. Schmitz

https://doi.org/10.1109/tsm.2012.2202752 Actions

Wafer Level Variability Improvement by Spatial Source/Drain Activation and Ion Implantation Super Scan for FinFET Technology

JOURNAL ARTICLE published August 2018 in IEEE Transactions on Semiconductor Manufacturing

Authors: Yanzhen Wang | Yoong Hooi Yong | Bingwu Liu | Dibao Zhou | Mitsuhiro Togo | Dongil Choi | Jae Gon Lee | Hsien-Ching Lo | Xinyuan Dou | Sipeng Gu | Shashidhar Shintri | Weihua Tong | Vidmantas Sargunas | Jorge Argandona

https://doi.org/10.1109/tsm.2018.2847040 Actions

IEEE Transactions on Semiconductor Manufacturing publication information

JOURNAL ARTICLE published February 2008 in IEEE Transactions on Semiconductor Manufacturing

https://doi.org/10.1109/tsm.2008.917921 Actions

IEEE Transactions on Semiconductor Manufacturing publication information

JOURNAL ARTICLE published August 2004 in IEEE Transactions on Semiconductor Manufacturing

https://doi.org/10.1109/tsm.2004.835040 Actions

IEEE Transactions on Semiconductor Manufacturing Information for authors

JOURNAL ARTICLE published August 2008 in IEEE Transactions on Semiconductor Manufacturing

https://doi.org/10.1109/tsm.2008.929184 Actions

IEEE Transactions on Semiconductor Manufacturing Information for authors

JOURNAL ARTICLE published February 2008 in IEEE Transactions on Semiconductor Manufacturing

https://doi.org/10.1109/tsm.2008.917922 Actions

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JOURNAL ARTICLE published February 2007 in IEEE Transactions on Semiconductor Manufacturing

https://doi.org/10.1109/tsm.2007.892051 Actions

A Novel Wafer-Yield PDF Model and Verification With 90–180-nm SOC Chips

JOURNAL ARTICLE published November 2008 in IEEE Transactions on Semiconductor Manufacturing

Authors: Hiroo Masuda | Manabu Tsunozaki | Toshikazu Tsutsui | Hiroyuki Nunogami | Akihisa Uchida | Kazuyuki Tsunokuni

https://doi.org/10.1109/tsm.2008.2005317 Actions

Measuring Power Distribution System Resistance Variations

JOURNAL ARTICLE published August 2008 in IEEE Transactions on Semiconductor Manufacturing

Authors: R. Helinski | J. Plusquellic

https://doi.org/10.1109/tsm.2008.2001222 Actions

Dielectric Relaxation of MIM Capacitor and Its Effect on Sigma-Delta A/D Converters

JOURNAL ARTICLE published November 2008 in IEEE Transactions on Semiconductor Manufacturing

Authors: Zhenqiu Ning | Herman Casier | Jeroen De Maeyer | Erik Heirman | Erwin De Vylder | Koen Noldus | Geert Van Herzeele | Dan Hegsted

https://doi.org/10.1109/tsm.2008.2004339 Actions

International Semiconductor Conference

JOURNAL ARTICLE published February 2007 in IEEE Transactions on Semiconductor Manufacturing

https://doi.org/10.1109/tsm.2007.892046 Actions

Advanced Method for Monitoring Copper Interconnect Process

JOURNAL ARTICLE published November 2008 in IEEE Transactions on Semiconductor Manufacturing

Authors: Kensuke Ishikawa | Kazunori Nemoto | Tomohiro Funakoshi | Hideo Ohta

https://doi.org/10.1109/tsm.2008.2005354 Actions

300-mm Prime Gaps That Need to Be Addressed to Boost Productivity

JOURNAL ARTICLE published November 2008 in IEEE Transactions on Semiconductor Manufacturing

Authors: Les Marshall | Kristin Rust | Kilian Schmidt

https://doi.org/10.1109/tsm.2008.2005363 Actions

IEEE Transactions on Semiconductor Manufacturing publication information

JOURNAL ARTICLE published November 2008 in IEEE Transactions on Semiconductor Manufacturing

https://doi.org/10.1109/tsm.2008.2008709 Actions

Table of contents

JOURNAL ARTICLE published November 2006 in IEEE Transactions on Semiconductor Manufacturing

https://doi.org/10.1109/tsm.2006.886953 Actions

Edge passivation and related electrical stability in silicon power devices

JOURNAL ARTICLE published 1990 in IEEE Transactions on Semiconductor Manufacturing

Authors: S. Salkalachen | N.H. Krishnan | S. Krishnan | H.B. Satyamurthy | K.S. Srinivas

https://doi.org/10.1109/66.47971 Actions

Acoustic Monitoring of Nonuniformly Eroded PVD Targets

JOURNAL ARTICLE published November 2006 in IEEE Transactions on Semiconductor Manufacturing

Authors: Liang Ban | Alireza K. Ziarani | Cetin Cetinkaya

https://doi.org/10.1109/tsm.2006.883592 Actions

Changes in the Editorial Board

JOURNAL ARTICLE published November 2006 in IEEE Transactions on Semiconductor Manufacturing

https://doi.org/10.1109/tsm.2006.884592 Actions

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JOURNAL ARTICLE published August 2006 in IEEE Transactions on Semiconductor Manufacturing

https://doi.org/10.1109/tsm.2006.882052 Actions
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