Metadata Search Funding Data Link References Status API Help
Facet browsing currently unavailable
Page 5 of 386 results
Sort by: relevance publication year

Interscorer Reliability Wechsler Preschool and Primary Scale of Intelligence

BOOK CHAPTER published 13 September 2016 in Comprehending Test Manuals

A 100MS/s 10-bit Split-SAR ADC with Capacitor Mismatch Compensation Using Built-In Calibration

PROCEEDINGS ARTICLE published May 2016 in 2016 IEEE 25th North Atlantic Test Workshop (NATW)

Authors: Yongsuk Choi | Yong-Bin Kim | In-Seok Jung

A 2.5-bit/cycle 10-bit 160-MS/s SAR ADC in 90-nm CMOS process

PROCEEDINGS ARTICLE published April 2016 in 2016 International Symposium on VLSI Design, Automation and Test (VLSI-DAT)

Authors: Chia-Hsin Lee | Chih-Huei Hou | Chun-Po Huang | Soon-Jyh Chang | Yuan-Ta Hsieh | Ying-Zong Juang

Session 10: Materials characterization

PROCEEDINGS ARTICLE published March 2016 in 2016 International Conference on Microelectronic Test Structures (ICMTS)

Authors: Bill Verzi

Introduction

BOOK CHAPTER published 13 January 2016 in The Test of Terrorism

Smooth Complex Orthogonal Decomposition Applied to Traveling Waves in Elastic Media

BOOK CHAPTER published 2016 in Rotating Machinery, Hybrid Test Methods, Vibro-Acoustics & Laser Vibrometry, Volume 8

Authors: Rickey A. Caldwell | Brain F. Feeny

Radiological and Clinical Features of Vein of Galen Aneurysmal Malformation In Newborn, Endovascular Interventional Treatment Management: 10 Years Experience

JOURNAL ARTICLE published 2016 in Tuberculin Skin Test in Children

Authors: Sinan Tüfekci | Asuman Çoban | Beril Yaşa | Meltem Bor | Mehmet Barburoğlu | Serra Sencer | Zeynep İnce

A 10 Gbps ADC-based equalizer for serial I/O receiver

PROCEEDINGS ARTICLE published December 2015 in 2015 10th International Design & Test Symposium (IDT)

Authors: Khaled A. El-Gammal | Ahmed N. Hassan | Sameh A. Ibrahim

A 2.5-D Memory-Logic Integration With Data-Pattern-Aware Memory Controller

JOURNAL ARTICLE published August 2015 in IEEE Design & Test

Authors: P. D. Sai Manoj

Implementation of high speed radix-10 parallel multiplier using Verilog

PROCEEDINGS ARTICLE published June 2015 in 2015 19th International Symposium on VLSI Design and Test

Authors: Sonam Negi | Pitchaiah Madduri

Implementation of high speed radix-10 parallel multiplier using Verilog

PROCEEDINGS ARTICLE published June 2015 in 2015 19th International Symposium on VLSI Design and Test

Authors: Sonam Negi | Pitchaiah Madduri

A 2.5 mW/ch, 50 Mcps, 10-analog channel, adaptively biased read-out front-end IC with 9.71 ps-RMS timing resolution for single-photon time-of-flight PET applications in 90 nm CMOS

PROCEEDINGS ARTICLE published April 2015 in VLSI Design, Automation and Test(VLSI-DAT)

Authors: Hugo Cruz | Hong-Yi Huang | Shueen-Yu Lee | Ching-Hsing Luo

Synthetic Instruments

BOOK CHAPTER published 2015 in Critical mm-Wave Components for Synthetic Automatic Test Systems

Authors: Michael Hrobak

Sub-10 nm FinFETs and Tunnel-FETs: From Devices to Systems

PROCEEDINGS ARTICLE published 2015 in Design, Automation & Test in Europe Conference & Exhibition (DATE), 2015

Authors: Ankit Sharma | A. Arun Goud | Kaushik Roy

10. Speichertest

BOOK CHAPTER published 31 December 2014 in Test digitaler Schaltkreise

A 22.4 fJ/conversion 0.7V 1.6μW 10-bit successive approximation ADC

PROCEEDINGS ARTICLE published April 2014 in Technical Papers of 2014 International Symposium on VLSI Design, Automation and Test

Authors: Meng-Lieh Sheu | Te-Hsiang Liu | Lin-Jie Tsao

A 1V 10-bit 500KS/s energy-efficient SAR ADC using Master-Slave DAC technique in 180nm CMOS

PROCEEDINGS ARTICLE published April 2014 in Technical Papers of 2014 International Symposium on VLSI Design, Automation and Test

Authors: Yi-Long Yu | Fu-Chen Huang | Chorng-Kuang Wang

article test doi

Example Item published 2014 in journal of test deposit

Authors: vai pat

HTTP Query metadata to DOI unixref

Example Item published 2014 in Reports of test CrossRef tools

Authors: v p

test article doi

Example Item published 2014 in journal of test deposit

Authors: a b