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[Advertisement] JOURNAL ARTICLE published February 1984 in IEEE Design & Test of Computers |
[Advertisement] JOURNAL ARTICLE published August 1984 in IEEE Design & Test of Computers |
[Advertisement] JOURNAL ARTICLE published May 1984 in IEEE Design & Test of Computers |
[Advertisement] JOURNAL ARTICLE published August 1984 in IEEE Design & Test of Computers |
[Advertisement] JOURNAL ARTICLE published February 1984 in IEEE Design & Test of Computers |
[Advertisement] JOURNAL ARTICLE published May 1984 in IEEE Design & Test of Computers |
[Advertisement] JOURNAL ARTICLE published August 1984 in IEEE Design & Test of Computers |
[Advertisement] JOURNAL ARTICLE published May 1984 in IEEE Design & Test of Computers |
[Advertisement] JOURNAL ARTICLE published May 1984 in IEEE Design & Test of Computers |
[Advertisement] JOURNAL ARTICLE published February 1984 in IEEE Design & Test of Computers |
[Advertisement] JOURNAL ARTICLE published February 1984 in IEEE Design & Test of Computers |
Linking Design&Test JOURNAL ARTICLE published May 1984 in IEEE Design & Test of Computers |
[Front cover] JOURNAL ARTICLE published May 1984 in IEEE Design & Test of Computers |
Membership Application JOURNAL ARTICLE published November 1984 in IEEE Design & Test of Computers |
Methods to reduce test application time for accumulator-based self-test PROCEEDINGS ARTICLE published in Proceedings. 15th IEEE VLSI Test Symposium (Cat. No.97TB100125) |
[Breaker page] JOURNAL ARTICLE published August 1984 in IEEE Design & Test of Computers |
Book Reviews JOURNAL ARTICLE published August 1984 in IEEE Design & Test of Computers |
Editorial Board JOURNAL ARTICLE published August 1984 in IEEE Design & Test of Computers |
[Breaker page] JOURNAL ARTICLE published February 1984 in IEEE Design & Test of Computers |
[Breaker page] JOURNAL ARTICLE published May 1984 in IEEE Design & Test of Computers |