Metadata Search Funding Data Link References Status API Help
Facet browsing currently unavailable
Page 4 of 434 results
Sort by: relevance publication year

[Advertisement]

JOURNAL ARTICLE published February 1984 in IEEE Design & Test of Computers

[Advertisement]

JOURNAL ARTICLE published August 1984 in IEEE Design & Test of Computers

[Advertisement]

JOURNAL ARTICLE published May 1984 in IEEE Design & Test of Computers

[Advertisement]

JOURNAL ARTICLE published August 1984 in IEEE Design & Test of Computers

[Advertisement]

JOURNAL ARTICLE published February 1984 in IEEE Design & Test of Computers

[Advertisement]

JOURNAL ARTICLE published May 1984 in IEEE Design & Test of Computers

[Advertisement]

JOURNAL ARTICLE published August 1984 in IEEE Design & Test of Computers

[Advertisement]

JOURNAL ARTICLE published May 1984 in IEEE Design & Test of Computers

[Advertisement]

JOURNAL ARTICLE published May 1984 in IEEE Design & Test of Computers

[Advertisement]

JOURNAL ARTICLE published February 1984 in IEEE Design & Test of Computers

[Advertisement]

JOURNAL ARTICLE published February 1984 in IEEE Design & Test of Computers

Linking Design&Test

JOURNAL ARTICLE published May 1984 in IEEE Design & Test of Computers

Authors: Robert E. Anderson

[Front cover]

JOURNAL ARTICLE published May 1984 in IEEE Design & Test of Computers

Membership Application

JOURNAL ARTICLE published November 1984 in IEEE Design & Test of Computers

Methods to reduce test application time for accumulator-based self-test

PROCEEDINGS ARTICLE published in Proceedings. 15th IEEE VLSI Test Symposium (Cat. No.97TB100125)

Authors: A.P. Stroele | F. Mayer

[Breaker page]

JOURNAL ARTICLE published August 1984 in IEEE Design & Test of Computers

Book Reviews

JOURNAL ARTICLE published August 1984 in IEEE Design & Test of Computers

Editorial Board

JOURNAL ARTICLE published August 1984 in IEEE Design & Test of Computers

[Breaker page]

JOURNAL ARTICLE published February 1984 in IEEE Design & Test of Computers

[Breaker page]

JOURNAL ARTICLE published May 1984 in IEEE Design & Test of Computers