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Nanometer range: A new theoretical challenge for microelectronics and optoelectronics

JOURNAL ARTICLE published July 2006 in Microelectronics Journal

Authors: Jean-François Eloy | Michel Depeyrot

https://doi.org/10.1016/j.mejo.2005.09.006 Actions

Failure Analysis Issues in Microelectromechanical Systems (MEMS)

JOURNAL ARTICLE published September 2005 in Microelectronics Reliability

Authors: J.A. Walraven

https://doi.org/10.1016/j.microrel.2005.07.088 Actions

Innos Ltd and The University of Southampton announce new technique for suppressing Boron Diffusion in Silicon-Germanium

JOURNAL ARTICLE published 1 April 2005 in Microelectronics International

https://doi.org/10.1108/mi.2005.21822aab.002 Actions

ULIS presents its latest new-generation 160 x 120 pixels infrared detector: the UL 02 05 1

JOURNAL ARTICLE published 1 April 2005 in Microelectronics International

https://doi.org/10.1108/mi.2005.21822aad.006 Actions

Understanding Semiconductor Devices; Sima Dimitrijev. Oxford University Press, New York. 2000. ISBN: 0-19-513186-X

JOURNAL ARTICLE published January 2001 in Microelectronics Reliability

Authors: Ninoslav Stojadinovic

https://doi.org/10.1016/s0026-2714(00)00102-5 Actions

STEM role in failure analysis

JOURNAL ARTICLE published September 2005 in Microelectronics Reliability

Authors: M.-A. Iannello | L. Tsung

https://doi.org/10.1016/j.microrel.2005.07.059 Actions

Heterojunction semiconductor triode—a new vertical device

JOURNAL ARTICLE published March 2005 in Microelectronics Journal

Authors: S. Mil'shtein | C. Gil | P. Ersland

https://doi.org/10.1016/j.mejo.2005.02.051 Actions

Hybrid Chemical and Physical Sensor Arrays

JOURNAL ARTICLE published 1 March 1993 in Microelectronics International

Authors: J.K. Atkinson

https://doi.org/10.1108/eb044509 Actions

Quantum Dot Heterostructures; D. Bimberg, M. Grundmann, N.N. Ledenstov; Wiley, New York, ISBN 0 471 97388 2, £90

JOURNAL ARTICLE published February 2000 in Microelectronics Journal

Authors: M Henini

https://doi.org/10.1016/s0026-2692(99)00093-2 Actions

Evaluating the reading sensitivity of a new thermomechanical data-storage technique

JOURNAL ARTICLE published November 2005 in Russian Microelectronics

Authors: A. B. Petrin

https://doi.org/10.1007/s11180-006-0005-3 Actions

Numerical and experimental analysis of EMI effects on circuits with MESFET devices

JOURNAL ARTICLE published April 2008 in Microelectronics Reliability

Authors: Han-Chang Tsai

https://doi.org/10.1016/j.microrel.2007.09.003 Actions

Wavelet analysis of coarsening during unstable MBE growth

JOURNAL ARTICLE published March 2005 in Microelectronics Journal

Authors: Z. Moktadir | M. Kraft

https://doi.org/10.1016/j.mejo.2005.02.109 Actions

Introduction to Modern Power Electronics; A.M. Trzynadlowski; Wiley, New York, 1998, 433 pages, hardbound, ISBN 0-471-15303-6, £48.50

JOURNAL ARTICLE published January 2000 in Microelectronics Journal

Authors: M Stojčev

https://doi.org/10.1016/s0026-2692(99)00067-1 Actions

The study on failure mechanisms of bond pad metal peeling: Part B––Numerical analysis

JOURNAL ARTICLE published December 2003 in Microelectronics Reliability

Authors: Insu Jeon

https://doi.org/10.1016/s0026-2714(03)00213-0 Actions

Numerical analysis of an ultralow switching loss IGBT with super junction and blocking junction

JOURNAL ARTICLE published December 2023 in Microelectronics Journal

Authors: Shu Zhao | Quanyuan Feng

https://doi.org/10.1016/j.mejo.2023.106012 Actions

Advanced electrical analysis of embedded memory cells using atomic force probing

JOURNAL ARTICLE published September 2005 in Microelectronics Reliability

Authors: M. Grützner

https://doi.org/10.1016/j.microrel.2005.07.054 Actions

Transient Analysis of Subnanosecond Integrated ADCs

JOURNAL ARTICLE published May 2005 in Russian Microelectronics

Authors: A. Marcinkevicius | D. Poviliauskas | V. Jasonis

https://doi.org/10.1007/s11180-005-0028-1 Actions

Reliability study of new SnZnAl lead-free solders used in CSP packages

JOURNAL ARTICLE published July 2005 in Microelectronics Reliability

Authors: Masayuki Kitajima | Tadaaki Shono

https://doi.org/10.1016/j.microrel.2004.10.011 Actions

New implementation of high linear LNA using derivative superposition method

JOURNAL ARTICLE published January 2009 in Microelectronics Journal

Authors: Shuguang Han | Baoyong Chi | Zhihua Wang

https://doi.org/10.1016/j.mejo.2008.09.007 Actions

Electronic spectra of quasi-regular Fibonacci systems: Analysis of simple 1D models

JOURNAL ARTICLE published October 2005 in Microelectronics Journal

Authors: V.R. Velasco

https://doi.org/10.1016/j.mejo.2005.05.021 Actions
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