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Divergence-type errors of smooth Barron-type density estimators

JOURNAL ARTICLE published June 2002 in Test

Authors: Jan Beirlant | Alain Berlinet | Gérard Biau | Igor Vajda

https://doi.org/10.1007/bf02595736 Actions

Meetpretentie

BOOK CHAPTER published 2008 in Scenario Test

Authors: Ineke van der Meulen | Jane van Gelder-Houthuizen | Jiska Wiegers | Sandra Wielaert | Mieke van de Sandt-Koenderman

https://doi.org/10.1007/978-90-313-6313-1_6 Actions

Afname

BOOK CHAPTER published 2008 in Scenario Test

Authors: Ineke van der Meulen | Jane van Gelder-Houthuizen | Jiska Wiegers | Sandra Wielaert | Mieke van de Sandt-Koenderman

https://doi.org/10.1007/978-90-313-6313-1_3 Actions

Validiteit

BOOK CHAPTER published 2008 in Scenario Test

Authors: Ineke van der Meulen | Jane van Gelder-Houthuizen | Jiska Wiegers | Sandra Wielaert | Mieke van de Sandt-Koenderman

https://doi.org/10.1007/978-90-313-6313-1_8 Actions

Inleiding

BOOK CHAPTER published 2008 in Scenario Test

Authors: Ineke van der Meulen | Jane van Gelder-Houthuizen | Jiska Wiegers | Sandra Wielaert | Mieke van de Sandt-Koenderman

https://doi.org/10.1007/978-90-313-6313-1_1 Actions

Betrouwbaarheid

BOOK CHAPTER published 2008 in Scenario Test

Authors: Ineke van der Meulen | Jane van Gelder-Houthuizen | Jiska Wiegers | Sandra Wielaert | Mieke van de Sandt-Koenderman

https://doi.org/10.1007/978-90-313-6313-1_7 Actions

Scoring en interpretatie

BOOK CHAPTER published 2008 in Scenario Test

Authors: Ineke van der Meulen | Jane van Gelder-Houthuizen | Jiska Wiegers | Sandra Wielaert | Mieke van de Sandt-Koenderman

https://doi.org/10.1007/978-90-313-6313-1_4 Actions

Doel en inhoud

BOOK CHAPTER published 2008 in Scenario Test

Authors: Ineke van der Meulen | Jane van Gelder-Houthuizen | Jiska Wiegers | Sandra Wielaert | Mieke van de Sandt-Koenderman

https://doi.org/10.1007/978-90-313-6313-1_2 Actions

Communicatie: achtergrond en onderzoeksbevindingen

BOOK CHAPTER published 2008 in Scenario Test

Authors: Ineke van der Meulen | Jane van Gelder-Houthuizen | Jiska Wiegers | Sandra Wielaert | Mieke van de Sandt-Koenderman

https://doi.org/10.1007/978-90-313-6313-1_5 Actions

Caring Analytics for Adults With Special Needs

JOURNAL ARTICLE published October 2015 in IEEE Design & Test

Research funded by Air Force Research Laboratory (DDDAS Program)

Authors: Marilyn Wolf | Mihaela van der Schaar

https://doi.org/10.1109/mdat.2015.2441717 Actions

Statistical Significance Of Defect density Estimates

PROCEEDINGS ARTICLE published in Proceedings of the IEEE International Conference on Microelectronic Test Structures

Authors: U. Kaempf

https://doi.org/10.1109/icmts.1988.672944 Actions

Implementing macro test in silicon compiler design

JOURNAL ARTICLE published April 1990 in IEEE Design & Test of Computers

Authors: F. Beenker | R. Dekker | R. Stans | M. Van der Star

https://doi.org/10.1109/54.53044 Actions

Increasing test accuracy by varying driver slew rate

JOURNAL ARTICLE published September 1991 in IEEE Design & Test of Computers

Authors: B. Dahlberg

https://doi.org/10.1109/54.84243 Actions

Fault (in)dependent cost estimates and conflict-directed backtracking to guide sequential circuit test generation

PROCEEDINGS ARTICLE published in Proceedings Eighth Asian Test Symposium (ATS'99)

Authors: M. Konijnenburg | H. van der Linden | A. van de Goor

https://doi.org/10.1109/ats.1999.810749 Actions

A New Procedure for Measuring High-Accuracy Probability Density Functions

PROCEEDINGS ARTICLE published November 2012 in 2012 IEEE 21st Asian Test Symposium

Authors: Takahiro J. Yamaguchi | Kunihiro Asada | Kiichi Niitsu | Mohamed Abbas | Satoshi Komatsu | Haruo Kobayashi | Jose A. Moreira

https://doi.org/10.1109/ats.2012.25 Actions

PPM-accuracy Error Estimates for Low-Cost Analog Test: A Case Study

PROCEEDINGS ARTICLE published May 2011 in 2011 IEEE 17th International Mixed-Signals, Sensors and Systems Test Workshop

Authors: Nathan Kupp | Haralampos Stratigopoulos | Petros Drineas | Yiorgos Makris

https://doi.org/10.1109/ims3tw.2011.15 Actions

Compact test sets for industrial circuits

PROCEEDINGS ARTICLE published in Proceedings 13th IEEE VLSI Test Symposium

Authors: M.H. Konijnenburg | J.T. van der Linden | A.J. van de Goor

https://doi.org/10.1109/vtest.1995.512661 Actions

A novel structure of MOSFET array to measure ioff-ion with high accuracy and high density

PROCEEDINGS ARTICLE published March 2015 in Proceedings of the 2015 International Conference on Microelectronic Test Structures

Authors: Tsuyoshi Suzuki | Yuzo Fukuzaki | Diederik Verkest | Hidetoshi Ohnuma | Ankur Anchlia | Vladimir Cherman | Hidetoshi Oishi | Shigetaka Mori | Julien Ryckaert | Kazuhisa Ogawa | Geert Van der Plas | Eric Beyne

https://doi.org/10.1109/icmts.2015.7106095 Actions

Test pattern generation with restrictors

PROCEEDINGS ARTICLE published in Proceedings of IEEE International Test Conference - (ITC)

Authors: M.H. Konijnenburg | J.T. van der Linden | A.J. van de Goor

https://doi.org/10.1109/test.1993.470644 Actions

Test generation and three-state elements, buses, and bidirectionals

PROCEEDINGS ARTICLE published in Proceedings of IEEE VLSI Test Symposium

Authors: J.Th. Van Der Linden | M.H. Konijnenburg | A.J. Van de Goor

https://doi.org/10.1109/vtest.1994.292325 Actions
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