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Some One-Sided Tests for Change in Level JOURNAL ARTICLE published February 1975 in Technometrics |
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Some One-Sided Tests for Change in Level JOURNAL ARTICLE published February 1975 in Technometrics |
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Characterization Problems in Mathematical Statistics JOURNAL ARTICLE published August 1975 in Technometrics |
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Regression Analysis: Theory, Methods, and Applications JOURNAL ARTICLE published November 1991 in Technometrics |
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A Survey of Statistical Design and Linear Models JOURNAL ARTICLE published November 1975 in Technometrics |
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The Minimum Mean Square Error Linear Estimator and Ridge Regression JOURNAL ARTICLE published February 1975 in Technometrics |
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Characterization Problems in Mathematical Statistics JOURNAL ARTICLE published August 1975 in Technometrics |
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The Minimum Mean Square Error Linear Estimator and Ridge Regression JOURNAL ARTICLE published February 1975 in Technometrics |
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Detecting Outliers in a Two-Way Table: I. Statistical Behavior of Residuals JOURNAL ARTICLE published February 1975 in Technometrics |
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Asymptotic Optimality of Likelihood Ratio Tests in Exponential Families JOURNAL ARTICLE published November 1980 in Technometrics |
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Use of Mean Deviation in the Analysis of Interlaboratory Tests JOURNAL ARTICLE published February 1967 in Technometrics |
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Asymptotic Optimality of Likelihood Ratio Tests in Exponential Families JOURNAL ARTICLE published November 1980 in Technometrics |
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Detecting Change Points by Fourier Analysis JOURNAL ARTICLE published August 1988 in Technometrics |
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Tests of Two-Parameter Exponentiality against Three-Parameter Weibull Alternatives JOURNAL ARTICLE published August 1975 in Technometrics |
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Detecting Outliers in a Two-Way Table: I. Statistical Behavior of Residuals JOURNAL ARTICLE published February 1975 in Technometrics |
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The Effect of Serial Correlation on the Performance of CUSUM Tests II JOURNAL ARTICLE published February 1975 in Technometrics |
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Use of Mean Deviation in the Analysis of Interlaboratory Tests JOURNAL ARTICLE published February 1967 in Technometrics |
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Tests of Two-Parameter Exponentialty Against Three-Parameter Weibull Alternatives JOURNAL ARTICLE published August 1975 in Technometrics |
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A Generalization of the Response Surface Mean Square Error Criterion with a Specific Application to the Scope JOURNAL ARTICLE published November 1975 in Technometrics |
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Detecting Change Points by Fourier Analysis JOURNAL ARTICLE published August 1988 in Technometrics |