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Network reliability evaluation: application of bathtub failure rate curve

JOURNAL ARTICLE published January 1982 in Microelectronics Reliability

https://doi.org/10.1016/0026-2714(82)90122-6 Actions

Approximate inference for location and scale parameters with application to failure-time data

JOURNAL ARTICLE published 1993 in IEEE Transactions on Reliability

Authors: R. Viveros

https://doi.org/10.1109/24.257829 Actions

WEIBULL-RELATED DISTRIBUTIONS FOR THE MODELLING OF BATHTUB SHAPED FAILURE RATE FUNCTIONS

BOOK CHAPTER published October 2003 in Mathematical and Statistical Methods in Reliability

Authors: M. Xie | C. D. Lai | D. N. P. Murthy

https://doi.org/10.1142/9789812795250_0019 Actions

Distinguishing between lognormal and Weibull distributions [time-to-failure data]

JOURNAL ARTICLE published March 2002 in IEEE Transactions on Reliability

Authors: S.R. Cain

https://doi.org/10.1109/24.994903 Actions

Bathtub Shaped Failure Rate Life Distributions

BOOK CHAPTER published in Stochastic Ageing and Dependence for Reliability

https://doi.org/10.1007/0-387-34232-x_3 Actions

Prediction intervals for Weibull observations, based on early-failure data

JOURNAL ARTICLE published 1996 in IEEE Transactions on Reliability

Authors: H.K. Hsieh

https://doi.org/10.1109/24.556591 Actions

Analyzing Reliability Data and Designing Acceptance Tests

JOURNAL ARTICLE published May 1966 in IEEE Transactions on Reliability

Authors: Cynthia Kolb Whitney

https://doi.org/10.1109/tr.1966.5217589 Actions

Shrunken estimators of Weibull shape parameter from type-II censored samples

JOURNAL ARTICLE published March 1993 in IEEE Transactions on Reliability

Authors: M. Pandey | U.S. Singh

https://doi.org/10.1109/24.210275 Actions

A Family of Additive Teissier–Weibull Hazard Distributions for Modeling Bathtub-Shaped Failure Time Data

JOURNAL ARTICLE published April 2023 in International Journal of Reliability, Quality and Safety Engineering

Research funded by Science and Engineering Research Board (ECR/2017/002416) | Banaras Hindu University (Scheme No. Dev. 6031)

Authors: Vikas Kumar Sharma | Sudhanshu Vikram Singh | Christophe Chesneau

https://doi.org/10.1142/s0218539323500031 Actions

The discrete additive Weibull distribution: A bathtub-shaped hazard for discontinuous failure data

JOURNAL ARTICLE published October 2012 in Reliability Engineering & System Safety

Authors: Mark Bebbington | Chin-Diew Lai | Morgan Wellington | Ričardas Zitikis

https://doi.org/10.1016/j.ress.2012.06.009 Actions

How to Identify a Bathtub Hazard Rate

JOURNAL ARTICLE published April 1987 in IEEE Transactions on Reliability

Authors: Magne Vollan Aarset

https://doi.org/10.1109/tr.1987.5222310 Actions

Percentiles of pivotal ratios for the MLE of the parameters of a Weibull regression model

JOURNAL ARTICLE published March 1993 in IEEE Transactions on Reliability

Authors: M.M. Bugaighis

https://doi.org/10.1109/24.210277 Actions

Reliability analysis of recovery blocks with nested clusters of failure points

JOURNAL ARTICLE published March 1993 in IEEE Transactions on Reliability

Authors: A. Csenki

https://doi.org/10.1109/24.210268 Actions

Failure mechanism models for cyclic fatigue

JOURNAL ARTICLE published 1993 in IEEE Transactions on Reliability

Authors: A. Dasgupta

https://doi.org/10.1109/24.273577 Actions

Estimation and testing in an imperfect-inspection model

JOURNAL ARTICLE published June 1993 in IEEE Transactions on Reliability

Authors: M.S. Srivastava | Y. Wu

https://doi.org/10.1109/24.229501 Actions

Simulation of HVDC transmission system failure rate bathtub curve based on Weibull distribution

PROCEEDINGS ARTICLE published November 2015 in 2015 IEEE 2nd International Future Energy Electronics Conference (IFEEC)

https://doi.org/10.1109/ifeec.2015.7361599 Actions

Network reliability evaluation: Application of bathtub failure rate curve

JOURNAL ARTICLE published January 1981 in Microelectronics Reliability

Authors: Balbir S. Dhillon

https://doi.org/10.1016/0026-2714(81)90549-7 Actions

“Weibull” decreasing hazard rate—help or hoax?

JOURNAL ARTICLE published October 1971 in Microelectronics Reliability

https://doi.org/10.1016/0026-2714(71)90119-3 Actions

Reliability estimation using doubly-censored field data

JOURNAL ARTICLE published June 1993 in IEEE Transactions on Reliability

Authors: J.A. Nachlas | A. Kumar

https://doi.org/10.1109/24.229499 Actions

Modeling failure-data by mixture of 2 Weibull distributions: a graphical approach

JOURNAL ARTICLE published 1995 in IEEE Transactions on Reliability

Authors: R. Jiang | D.N.P. Murthy

https://doi.org/10.1109/24.406588 Actions
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