Linear Estimation of a Regression Relationship from Censored Data—Part II Best Linear Unbiased Estimation and Theory

JOURNAL ARTICLE published February 1973 in Technometrics

Authors: Wayne Nelson | Gerald J. Hahn

Confidence Limits on MTBF for Sequential Test Plans of MIL-STD 781

JOURNAL ARTICLE published February 1979 in Technometrics

Authors: Clifford M. Bryant | Josef Schmee

Prediction Limits and Two-Sample Problems with Complete or Censored Weibull Data

JOURNAL ARTICLE published May 1979 in Technometrics

Authors: Max Engelhardt | Lee J. Bain

Analysis of Messy Data, Volume I: Designed Experiments

JOURNAL ARTICLE published November 1985 in Technometrics

Authors: Josef Schmee

[Robust Diagnostic Data Analysis: Transformations in Regression]: Discussion

JOURNAL ARTICLE published November 2000 in Technometrics

Authors: R. Dennis Cook

Latent Root Regression: Large Sample Analysis

JOURNAL ARTICLE published November 1979 in Technometrics

Authors: J. W. White | R. F. Gunst

Modified Semiparametric Maximum Likelihood Estimator in Linear Regression Analysis With Complete Data or Right-Censored Data

JOURNAL ARTICLE published February 2005 in Technometrics

Authors: Qiqing Yu | George Y.C Wong

Confidence Limits for Parameters of a Normal Distribution from Singly Censored Samples, Using Maximum Likelihood

JOURNAL ARTICLE published May 1985 in Technometrics

Authors: Josef Schmee | David Gladstein | Wayne Nelson

Analysis of Messy Data, Volume I: Designed Experiments

JOURNAL ARTICLE published November 1985 in Technometrics

Authors: Josef Schmee | George A. Milliken | Dallas E. Johnson

Nonlinear Regression With Censored Data

JOURNAL ARTICLE published February 2007 in Technometrics

Authors: Cédric Heuchenne | Ingrid Van Keilegom

Latent Root Regression: Large Sample Analysis

JOURNAL ARTICLE published November 1979 in Technometrics

Authors: J. W. White | R. F. Gunst

Comparisons of Approximate Confidence Intervals for Distributions Used in Life-Data Analysis

JOURNAL ARTICLE published May 1993 in Technometrics

Authors: Necip Doganaksoy | Josef Schmee

[Events Defined by Duration and Severity, with an Application to Network Reliability]: Discussion

JOURNAL ARTICLE published August 1998 in Technometrics

Authors: Josef Schmee

Statistical Tables for Multivariate Analysis

JOURNAL ARTICLE published August 1984 in Technometrics

Authors: Josef Schmee | Heinz Kres

Confidence Limits for Parameters of a Normal Distribution From Singly Censored Samples, Using Maximum Likelihood

JOURNAL ARTICLE published May 1985 in Technometrics

Authors: Josef Schmee | David Gladstein | Wayne Nelson

A New Approach to Testing Goodness of Fit for Censored Samples

JOURNAL ARTICLE published November 1979 in Technometrics

Authors: John R. Michael | William R. Schucany

Analysis of Residuals from Censored Data

JOURNAL ARTICLE published November 1973 in Technometrics

Authors: Wayne Nelson

Outliers in Statistical Data

JOURNAL ARTICLE published February 1986 in Technometrics

Authors: Josef Schmee | Vic Barnett | Toby Lewis

The Analysis of Cross-Tabulated Data

JOURNAL ARTICLE published November 1979 in Technometrics

Authors: Gary A. Simon

Sequential Analysis, Tests and Confidence Intervals

JOURNAL ARTICLE published February 1987 in Technometrics

Authors: Josef Schmee | David Siegmund