Some Results on Point Estimation for the Two-Parameter Weibull or Extreme-Value Distribution

JOURNAL ARTICLE published February 1974 in Technometrics

Authors: Max Engelhardt | Lee J. Bain

Tests of Two-Parameter Exponentiality against Three-Parameter Weibull Alternatives

JOURNAL ARTICLE published August 1975 in Technometrics

Authors: Max Engelhardt | Lee J. Bain

Prediction Intervals for the Weibull Process

JOURNAL ARTICLE published May 1978 in Technometrics

Authors: Max Engelhardt | Lee J. Bain

Construction of Optimal Unbiased Inference Procedures for the Parameters of the Gamma Distribution

JOURNAL ARTICLE published November 1978 in Technometrics

Authors: Max Engelhardt | Lee J. Bain

Bayesian confidence limits for the reliability of mixed exponential and distribution-free cascade subsystems

JOURNAL ARTICLE published April 1972 in Microelectronics Reliability

Maximum Likelihood Parameter Estimation for the Quartic Exponential Distribution

JOURNAL ARTICLE published November 1978 in Technometrics

Authors: A. W. Matz

Some Results on Point Estimation for the Two-Parameter Weibull or Extreme-Value Distribution

JOURNAL ARTICLE published February 1974 in Technometrics

Authors: Max Engelhardt | Lee J. Bain

Approximate Fiducial Bounds on Reliability for the Two Parameter Negative Exponential Distribution

JOURNAL ARTICLE published November 1971 in Technometrics

Authors: Frank E. Grubbs

Confidence limits for reliability and tolerance limits in the inverse Weibull distribution

JOURNAL ARTICLE published January 1989 in Reliability Engineering & System Safety

Authors: R. Calabria | G. Pulcini

Tests of Two-Parameter Exponentialty Against Three-Parameter Weibull Alternatives

JOURNAL ARTICLE published August 1975 in Technometrics

Authors: Max Engelhardt | Lee J. Bain

Prediction Intervals for the Weibull Process

JOURNAL ARTICLE published May 1978 in Technometrics

Authors: Max Engelhardt | Lee J. Bain

Fiducial, Frequency, and Bayesian Inference on Reliability for the Two Parameter Negative Exponential Distribution

JOURNAL ARTICLE published May 1973 in Technometrics

Authors: Donald A. Pierce

Confidence Limits for Systems Consisting of Units with Exponential Distribution of Time to Failure

OTHER published 16 April 1999 in Statistical Reliability Engineering

Approximate Fiducial Bounds on Reliability for the Two Parameter Negative Exponential Distribution

JOURNAL ARTICLE published November 1971 in Technometrics

Authors: Frank E. Grubbs

Approximate Confidence Limits for the Reliability of Series and Parallel Systems

JOURNAL ARTICLE published November 1965 in Technometrics

Authors: Albert Madansky

Inferences for the Two-Parameter Exponential Distribution Under Type I Censored Sampling

JOURNAL ARTICLE published September 1978 in Journal of the American Statistical Association

Authors: F. T. Wright | Max Engelhardt | Lee J. Bain

Tolerance Limits for a Binomial Distribution

JOURNAL ARTICLE published February 1969 in Technometrics

Bayesian Confidence Limits for the Reliability of Mixed Exponential and Distribution-Free Cascade Subsystems

JOURNAL ARTICLE published February 1971 in IEEE Transactions on Reliability

Authors: Melvin D. Springer | James K. Byers

Uniformly Most Powerful Unbiased Tests on the Scale Parameter of a Gamma Distribution with a Nuisance Shape Parameter

JOURNAL ARTICLE published February 1977 in Technometrics

Authors: Max Engelhardt | Lee J. Bain

Bayes Confidence Limits for Reliability of Redundant Systems

JOURNAL ARTICLE published February 1975 in Technometrics

Authors: William E. Thompson | Eugene Y. Chang