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Tolerance Limits and Confidence Limits on Reliability for the Two-Parameter Exponential Distribution

JOURNAL ARTICLE published February 1978 in Technometrics

Authors: Max Engelhardt | Lee J. Bain

https://doi.org/10.1080/00401706.1978.10489615 Actions

Tolerance Limits and Confidence Limits on Reliability for the Two-Parameter Exponential Distribution

JOURNAL ARTICLE published February 1978 in Technometrics

Authors: Max Engelhardt | Lee J. Bain

https://doi.org/10.2307/1268159 Actions

Simple Approximate Distributional Results for Confidence and Tolerance limits for the Weibull Distribution Based on Maximum likelihood Estimators

JOURNAL ARTICLE published February 1981 in Technometrics

Authors: Lee J. Bain | Max Engelhardt

https://doi.org/10.1080/00401706.1981.10486231 Actions

Simple Approximate Distributional Results for Confidence and Tolerance Limits for the Weibull Distribution Based on Maximum Likelihood Estimators

JOURNAL ARTICLE published February 1981 in Technometrics

Authors: Lee J. Bain | Max Engelhardt

https://doi.org/10.2307/1267970 Actions

Interval Estimation for the Two-Parameter Double Exponential Distribution

JOURNAL ARTICLE published November 1973 in Technometrics

Authors: Lee J. Bain | Max Engelhardt

https://doi.org/10.2307/1267397 Actions

Some Approximations for Tolerance Factors for the Two Parameter Exponential Distribution

JOURNAL ARTICLE published August 1978 in Technometrics

Authors: Ian R. Dunsmore

https://doi.org/10.2307/1268141 Actions

Maximum Likelihood Estimation, Exact Confidence Intervals for Reliability, and Tolerance Limits in the Weibull Distribution

JOURNAL ARTICLE published May 1970 in Technometrics

Authors: Darrel R. Thoman | Lee J. Bain | Charles E. Antle

https://doi.org/10.2307/1267240 Actions

Interval Estimation for the Two-parameter Double Exponential Distribution

JOURNAL ARTICLE published November 1973 in Technometrics

Authors: Lee J. Bain | Max Engelhardt

https://doi.org/10.1080/00401706.1973.10489120 Actions

Some Approximations for Tolerance Factors for the Two Parameter Exponential Distribution

JOURNAL ARTICLE published August 1978 in Technometrics

Authors: Ian R. Dunsmore

https://doi.org/10.1080/00401706.1978.10489677 Actions

Maximum Likelihood Estimation, Exact Confidence Intervals for Reliability, and Tolerance Limits in the Weibull Distribution

JOURNAL ARTICLE published May 1970 in Technometrics

Authors: Darrel R. Thoman | Lee J. Bain | Charles E. Antler

https://doi.org/10.1080/00401706.1970.10488674 Actions

Parameter-Free and Nonparametric Tolerance Limits: The Exponential Case

JOURNAL ARTICLE published February 1962 in Technometrics

Authors: Leo A. Goodman | Albert Madansky

https://doi.org/10.2307/1266174 Actions

On Prediction Limits for Samples from a Weibull or Extreme-Value Distribution

JOURNAL ARTICLE published May 1982 in Technometrics

Authors: Max Engelhardt | Lee J. Bain

https://doi.org/10.2307/1268494 Actions

Prediction Limits and Two-Sample Problems with Complete or Censored Weibull Data

JOURNAL ARTICLE published May 1979 in Technometrics

Authors: Max Engelhardt | Lee J. Bain

https://doi.org/10.2307/1268521 Actions

On Prediction Limits for Samples From a Weibull or Extreme-Value Distribution

JOURNAL ARTICLE published May 1982 in Technometrics

Authors: Max Engelhardt | Lee J. Bain

https://doi.org/10.1080/00401706.1982.10487738 Actions

Parameter-Free and Nonparametric Tolerance Limits: The Exponential Case

JOURNAL ARTICLE published February 1962 in Technometrics

Authors: Leo A. Goodman | Albert Madansky

https://doi.org/10.1080/00401706.1962.10489989 Actions

Prediction Limits and Two-Sample Problems with Complete or Censored Weibull Data

JOURNAL ARTICLE published May 1979 in Technometrics

Authors: Max Engelhardt | Lee J. Bain

https://doi.org/10.1080/00401706.1979.10489754 Actions

Maximum Likelihood Parameter Estimation for the Quartic Exponential Distribution

JOURNAL ARTICLE published November 1978 in Technometrics

Authors: A. W. Matz

https://doi.org/10.2307/1267648 Actions

Construction of Optimal Unbiased Inference Procedures for the Parameters of the Gamma Distribution

JOURNAL ARTICLE published November 1978 in Technometrics

Authors: Max Engelhardt | Lee J. Bain

https://doi.org/10.2307/1267649 Actions

Some Results on Point Estimation for the Two-Parameter Weibull or Extreme-Value Distribution

JOURNAL ARTICLE published February 1974 in Technometrics

Authors: Max Engelhardt | Lee J. Bain

https://doi.org/10.2307/1267491 Actions

Tests of Two-Parameter Exponentiality against Three-Parameter Weibull Alternatives

JOURNAL ARTICLE published August 1975 in Technometrics

Authors: Max Engelhardt | Lee J. Bain

https://doi.org/10.2307/1268073 Actions
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