Estimation of the Parameters of Two Parameter Exponential Distributions from Censored Samples

JOURNAL ARTICLE published August 1960 in Technometrics

Authors: Benjamin Epstein

Estimation of the Parameters of Two Parameter Exponential Distributions from Censored Samples

JOURNAL ARTICLE published August 1960 in Technometrics

Authors: Benjamin Epstein

On Testing the Equality of Two Exponential Distributions

JOURNAL ARTICLE published August 1981 in Technometrics

Authors: Hui Kuang Hsieh

Interval Estimation for the Two-Parameter Double Exponential Distribution

JOURNAL ARTICLE published November 1973 in Technometrics

Authors: Lee J. Bain | Max Engelhardt

Interval Estimation for the Two-parameter Double Exponential Distribution

JOURNAL ARTICLE published November 1973 in Technometrics

Authors: Lee J. Bain | Max Engelhardt

Point and Interval Estimation Procedures for the Two-Parameter Weibull and Extreme-Value Distributions

JOURNAL ARTICLE published May 1968 in Technometrics

Authors: Nancy R. Mann

Estimation of Weibull Distribution Shape Parameter When No More Than Two Failures Occur per Lot

JOURNAL ARTICLE published November 1964 in Technometrics

Authors: J. L. Jaech

Point and Interval Estimation Procedures for the Two-Parameter Weibull and Extreme-Value Distributions

JOURNAL ARTICLE published May 1968 in Technometrics

Authors: Nancy R. Mann

Estimation of Quantiles of Location-Scale Distributions Based on Two or Three Order Statistics

JOURNAL ARTICLE published November 1980 in Technometrics

Authors: Peter Kubat | Benjamin Epstein

Tolerance Limits and Confidence Limits on Reliability for the Two-Parameter Exponential Distribution

JOURNAL ARTICLE published February 1978 in Technometrics

Authors: Max Engelhardt | Lee J. Bain

Estimation of Weibull Distribution Shape Parameter When no More than Two Failures Occur per Lot

JOURNAL ARTICLE published November 1964 in Technometrics

Authors: J. L. Jaech

Estimation in the Exponential Distribution

JOURNAL ARTICLE published May 1973 in Technometrics

Authors: A. Clifford Cohen | Frederick Russell Helm

Maximum Likelihood Parameter Estimation for the Quartic Exponential Distribution

JOURNAL ARTICLE published November 1978 in Technometrics

Authors: A. W. Matz

Estimation of Quantiles of Location-Scale Distributions Based on Two or Three Order Statistics

JOURNAL ARTICLE published November 1980 in Technometrics

Authors: Peter Kubat | Benjamin Epstein

Linear Order Statistic Estimation for the Two-Parameter Weibull and Extreme-Value Distributions from Type II Progressively Censored Samples

JOURNAL ARTICLE published August 1972 in Technometrics

Authors: David R. Thomas | Wanda M. Wilson

Confidence Intervals for the Exponential Scale Parameter Using Optimally Selected Order Statistics

JOURNAL ARTICLE published May 1972 in Technometrics

Authors: Kenneth S. Kaminsky

Estimation in the Exponential Distribution

JOURNAL ARTICLE published May 1973 in Technometrics

Authors: A. Clifford Cohen | Frederick Russell Helm

A Two-Stage Life Test for the Exponential Parameter

JOURNAL ARTICLE published May 1988 in Technometrics

Authors: Kenneth Fairbanks

Prediction Intervals for the Two Parameter Exponential Distribution

JOURNAL ARTICLE published November 1977 in Technometrics

Authors: J. F. Lawless

Maximum Likelihood Parameter Estimation for the Quartic Exponential Distribution

JOURNAL ARTICLE published November 1978 in Technometrics

Authors: A. W. Matz