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Showing DOI matching 10.1016/j.microrel.2020.113823

Reliability analysis in GeTe and GeSbTe based phase-change memory 4 kb arrays targeting storage class memory applications

JOURNAL ARTICLE published November 2020 in Microelectronics Reliability

Authors: G. Lama | G. Bourgeois | M. Bernard | N. Castellani | J. Sandrini | E. Nolot | J. Garrione | M.C. Cyrille | G. Navarro | E. Nowak

https://doi.org/10.1016/j.microrel.2020.113823 Actions
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