Tolerance Limits and Confidence Limits on Reliability for the Two-Parameter Exponential Distribution

JOURNAL ARTICLE published February 1978 in Technometrics

Authors: Max Engelhardt | Lee J. Bain

Tolerance Limits and Confidence Limits on Reliability for the Two-Parameter Exponential Distribution

JOURNAL ARTICLE published February 1978 in Technometrics

Authors: Max Engelhardt | Lee J. Bain

Simple Approximate Distributional Results for Confidence and Tolerance limits for the Weibull Distribution Based on Maximum likelihood Estimators

JOURNAL ARTICLE published February 1981 in Technometrics

Authors: Lee J. Bain | Max Engelhardt

Simple Approximate Distributional Results for Confidence and Tolerance Limits for the Weibull Distribution Based on Maximum Likelihood Estimators

JOURNAL ARTICLE published February 1981 in Technometrics

Authors: Lee J. Bain | Max Engelhardt

Approximate Tolerance Limits and Confidence Limits on Reliability for the Gamma Distribution

JOURNAL ARTICLE published June 1984 in IEEE Transactions on Reliability

Authors: Max Engelhardt | Wei-Kei Shiue

Interval Estimation for the Two-Parameter Double Exponential Distribution

JOURNAL ARTICLE published November 1973 in Technometrics

Authors: Lee J. Bain | Max Engelhardt

Some Approximations for Tolerance Factors for the Two Parameter Exponential Distribution

JOURNAL ARTICLE published August 1978 in Technometrics

Authors: Ian R. Dunsmore

Maximum Likelihood Estimation, Exact Confidence Intervals for Reliability, and Tolerance Limits in the Weibull Distribution

JOURNAL ARTICLE published May 1970 in Technometrics

Authors: Darrel R. Thoman | Lee J. Bain | Charles E. Antle

Interval Estimation for the Two-parameter Double Exponential Distribution

JOURNAL ARTICLE published November 1973 in Technometrics

Authors: Lee J. Bain | Max Engelhardt

Some Approximations for Tolerance Factors for the Two Parameter Exponential Distribution

JOURNAL ARTICLE published August 1978 in Technometrics

Authors: Ian R. Dunsmore

Maximum Likelihood Estimation, Exact Confidence Intervals for Reliability, and Tolerance Limits in the Weibull Distribution

JOURNAL ARTICLE published May 1970 in Technometrics

Authors: Darrel R. Thoman | Lee J. Bain | Charles E. Antler

On Prediction Limits for Samples from a Weibull or Extreme-Value Distribution

JOURNAL ARTICLE published May 1982 in Technometrics

Authors: Max Engelhardt | Lee J. Bain

Parameter-Free and Nonparametric Tolerance Limits: The Exponential Case

JOURNAL ARTICLE published February 1962 in Technometrics

Authors: Leo A. Goodman | Albert Madansky

Approximate tolerance limits and confidence limits on reliability for the Gamma distribution

JOURNAL ARTICLE published January 1985 in Microelectronics Reliability

Prediction Limits and Two-Sample Problems with Complete or Censored Weibull Data

JOURNAL ARTICLE published May 1979 in Technometrics

Authors: Max Engelhardt | Lee J. Bain

Parameter-Free and Nonparametric Tolerance Limits: The Exponential Case

JOURNAL ARTICLE published February 1962 in Technometrics

Authors: Leo A. Goodman | Albert Madansky

On Prediction Limits for Samples From a Weibull or Extreme-Value Distribution

JOURNAL ARTICLE published May 1982 in Technometrics

Authors: Max Engelhardt | Lee J. Bain

Prediction Limits and Two-Sample Problems with Complete or Censored Weibull Data

JOURNAL ARTICLE published May 1979 in Technometrics

Authors: Max Engelhardt | Lee J. Bain

Construction of Optimal Unbiased Inference Procedures for the Parameters of the Gamma Distribution

JOURNAL ARTICLE published November 1978 in Technometrics

Authors: Max Engelhardt | Lee J. Bain

Maximum Likelihood Parameter Estimation for the Quartic Exponential Distribution

JOURNAL ARTICLE published November 1978 in Technometrics

Authors: A. W. Matz